Using a unique approach, the author examines both reliability physics and reliability statistics to reveal how they can be employed in order to discover why components fail and how failures develop over time. The text introduces several important reliability concepts and then divides into three key areas--modelling, evaluation and assurance.The text introduces several important reliability concepts and then divides into three key areas--modelling, evaluation and assurance.
Title | : | Electronic component reliability |
Author | : | Finn Jensen |
Publisher | : | John Wiley & Sons Inc - 1995 |
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